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Wednesday, July 22, 2020 | History

2 edition of Characterization of alternating-current thin-film SrS:Ce electroluminescent devices found in the catalog.

Characterization of alternating-current thin-film SrS:Ce electroluminescent devices

Robert L. Thuemler

Characterization of alternating-current thin-film SrS:Ce electroluminescent devices

by Robert L. Thuemler

  • 2 Want to read
  • 17 Currently reading

Published .
Written in English

    Subjects:
  • Electroluminescent display systems.,
  • Thin film devices.,
  • Phosphors.

  • Edition Notes

    Statementby Robert L. Thuemler.
    The Physical Object
    Pagination61 leaves, bound :
    Number of Pages61
    ID Numbers
    Open LibraryOL15479966M

    Modification of dielectric-phosphor interface in alternating current thin film electroluminescent display devices by Britton, James David, M.S., The University of Texas at El Paso, , 73 pages; AAT EP • Electro-optical characterization of alternating current thin film electroluminescent display devices by Krishna, Srinivas, M.S. The advent of electroluminescent (EL) fibers, which emit light in response to an applied electric field, has opened the door for fabric-integrated light emission and displays in textiles. However, there have been few technical publications over the past few years about the performance of these light emitting fibers inside functional fabrics. Thus, there is limited information on the .

    The Fourth International Workshop on Electroluminescence (EL) was held at the Hotel Holiday, Tottori, Japan, October , This workshop was sponsored by the Research Committee on Mutual Conversion between Light and Electricity, Japan Society for the Promotion of Science, in cooperation with SID (Society for Infonnation Display) Japan Chapter, Tottori . Abu-Dayah, J. F. Wager, and S. Kobayashi, "Electrical Characterization of Atomic Layer Epitaxy ZnS:Mn Alternating-Current Thin-Film Electroluminescent Devices Subject to Various Waveforms," J. Appl. Phys. 74, ().

    Optical Characterization XEOL Measurements Difficulties with LPE Conclusions References Chapter 6 - γ-CuBr Thin Films and Electroluminescent Devices Structural Properties of Evaporated γ-CuBr Films Optical Properties of Evaporated γ-CuBr Films   An extremely stretchable electroluminescent device is fabricated based on alternating‐current electroluminescent (ACEL) materials and ionic conductors. The stretchable ACEL device possesses extremely high stretchability, and can be linearly stretched to % with the luminance being maintained at 70% of the initial value before stretching.


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Characterization of alternating-current thin-film SrS:Ce electroluminescent devices by Robert L. Thuemler Download PDF EPUB FB2

The operation of alternating-current thin-film electroluminescent (ACTFEL) devices may be strongly affected by the presence of dynamic or static positive space charge within the phosphor layer. The SrS: Ce³⁺ thin film active phosphor layer of different thickness based alternating current thin-film electroluminescent (ACTFEL) devices are fabricated by electron beam.

SrS: Ce is a promising phosphor material for blue and white alternating current thin-film electroluminescent (ACTFEL) devices. The development of full-color ACTFEL flat-panel displays has motivated researchers to explore a variety of phosphor host/luminescent impurity combinations.Cited by: 2.

Characterization of alternating-current thin-film SrS:Ce electroluminescent devices By Download PDF (4 MB). The SrS: Ce 3+ thin film active phosphor layer of different thickness based alternating current thin-film electroluminescent (ACTFEL) devices are fabricated by electron beam evaporation deposition (EBED) method.

The morphology and chemical composition of the deposited films are investigated by field emission scanning electron microscopy (FESEM).Cited by: 2. A high-luminance, high-efficiency, full-color alternating-current thin-film electroluminescent (ACTFEL) phosphor system, capable of being processed at temperatures below the glass substrate melting temperature, has been developed through the use of source layer diffusion doping (SLDD) of atomic layer epitaxy (ALE) deposited SrS thin-films.

We suggest a formalism built on the analogy between the pressure-volume (P–Ṽ) diagram of a gas system and the charge-voltage (Q–V) characteristics of the alternating-current thin-film electroluminescent (ACTFEL) device.

The formalism extends the understanding of the processes in ACTFEL devices and the complete characterization of their internal parameters. Characterization of alternating-current thin-film SrS:Ce electroluminescent devices", M.S.

Thesis, (). Charge transfer in ZnS-type electroluminescence", (). Chemical vapor deposition of ZnS:Mn electroluminescent film in a lowpressure halogen transport system". Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are reviewed.

Particular emphasis is devoted to electrical characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties.

Electrical characterization methods for the analysis of alternating current thin- film electroluminescent (ACTFEL) devices are reviewed. Particular emphasis is devoted to electrical characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties.

20 April Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices. Nataliya A the PDP spectra of ZnS:Mn and SrS:Ce devices fabricated by various techniques.

photodepolarization spectra for diagnostics and characterization of alternating current thin. INTRODUCTION An alternating-current thin-film electroluminescent (ACTFEL) device is a solid state display device in which some type of an alternating-current (ac) voltage waveform is applied to the electrical contacts of a thin-film stack in order to induce light emission (1).

The electrical response of ZnS:Mn alternating‐current thin‐film electroluminescent devices grown by atomic layer epitaxy (ALE) is studied by systematically varying the characteristics of the standard driving waveform.

Charge‐voltage, capacitance‐voltage, and internal charge‐phosphor field analysis are used to accomplish electrical analysis. Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are reviewed.

Particular emphasis is devoted to electrical characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. A systematic. Read "Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices, Proceedings of SPIE" on DeepDyve, the largest online rental service for scholarly research with thousands of academic publications available at your fingertips.

ZnMgS:Mn ACTFEL Devices ZnIlxMgS-based Thin Film Growth ZnMgS:Mn electroluminescent thin film devices were only reported by Noma and Minami, et al. in In this report, ZnMgS:Mn films were grown on glass/ITO/SiO2/SiNx by e-beam deposition. Mn doping was provided from a MnS source.

Characterization of Alternating-Current Thin-Film SrS:Ce Electroluminescent Devices by Robert L. Thuemler A THESIS submitted to Oregon State University in partial fulfillment of the requirements for the degree of Master of Science Presented.

Alternating Current Thin Film Electroluminescent (ACTFEL) displays are the future of display devices. They are rugged, lightweight and portable; have low power consumption, wide view angle, fast response, and unlike the cathode ray tube, do not emit radiation, At UTEP, these devices are fabricated in a vacuum system affectionately named Mariah.

Very recently, we have developed two types of bright white-light emitting thin film EL devices with new phosphors, SrS:Pr,K and SrS:Ce,K,Eu [1–3], White-light EL devices have the following important characteristics; White-light EL displays with a reverse mode are superior from an ergonomics point of view, because characters and/or figures are.

Device structure was proposed earlier by Russ and Kennedy. Mito et al. showed that thin-film EL panels could be used as a TV imaging system. Uede, Takeda and their coworkers reported on the production of practical ZnS:Mn ac thin-film EL display units.

Sharp introduces the first commercial ZnS:Mn ac thin-film monochrome display. Humidity sensors are indispensable for various electronic systems and instrumentations.

To develop a new humidity sensing mechanism is the key for the next generation of sensor technology. In this work, a novel flexible paper-based current humidity sensor is proposed. The developed alternating current electroluminescent devices (ACEL) consist of the electroless ."Characterization of Alternating-Current Thin-Film SrS:Ce Electroluminescent Devices," M.S., James K.

Mendes Degrees and Theses "Sine Burst Waveform Aging and Electro-Optic Characterization of ALE ZnS:Mn ACTFEL Devices for Head-Mounted Active Matrix Displays," M.S., The Fourth International Workshop on Electroluminescence (EL) was held at the Hotel Holiday, Tottori, Japan, OctoberThis workshop was sponsored by the Research Committee on Mutual Conversion between Light and Electricity, Japan Society for .